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Search Results for "Thin Films -- Analysis"

Subject: Thin Films -- Analysis
Author(s): Feldman, Leonard C. and J. W. Mayer

Fundamentals of surface and thin film analysis / Leonard C. Feldman and J.W. Mayer. New York, N.Y. : North-Holland, c1986. xviii, 352 p. : ill.

Location: DeLaMare Library  QD 506 .F39 1986