Practical surface analysis : by auger and x-ray photo-electron spectroscopy / edited by D. Briggs and M. P. Seah. New York : Wiley, c1983. xvi, 533 p. : ill.
Fundamentals of surface and thin film analysis / Leonard C. Feldman and J.W. Mayer. New York, N.Y. : North-Holland, c1986. xviii, 352 p. : ill.
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Please direct questions to Tod Colegrove
Updated 22 April 2013